Abstract
The Modulated Scatterer Technique (MST) Has Shown Promise for Applications in Microwave Imaging, Electric Field Mapping, and Materials Characterization. Traditionally, MST Scatterers Are Dipoles Centrally Loaded with an Element Capable of Modulation (E.g., a PIN Diode). by Modulating the Load Element State, the Scattered Fields Are Also Modulated. However, Due to the Small Size of Such Scatterers, It Can Be Difficult to Reliably Detect the Response. Increasing the Modulation Depth (MD) of the Scattered Signal May Improve Detectability. This Paper Presents Simulations and Measurements of PCB-Based MST Elements that, through Reactive Loading, Are Designed to Be Electrically Invisible during the Reverse Bias State of the Modulated Element (A PIN Diode in This Case) While Producing Detectable Scattering during the Forward Bias State. the Results Show a Significant (> 90%) Improvement in the MD of the Scattered Signal When Compared to a Traditional MST Scatterer.
Recommended Citation
D. A. Crocker and K. M. Donnell, "PCB based Modulated Scatter with Enhanced Modulation Depth," IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), pp. 333 - 334, Institute of Electrical and Electronics Engineers, Jan 2023.
The definitive version is available at https://doi.org/10.1109/USNC-URSI52151.2023.10237897
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-166544228-2
International Standard Serial Number (ISSN)
1522-3965
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2023
