Method Of Effective Roughness Dielectric In A PCB: Measurement And Full-Wave Simulation Verification
Abstract
Surface roughness topography of printed circuit boards (PCBs) needs to be included in signal integrity simulations in order to accurately predict the insertion loss of the structure and its delay time. An effective roughness dielectric (ERD) model can be used to substitute an inhomogeneous interface between copper foil and laminate dielectric in a PCB. Herein, this approach is tested for verification using 3-D full-wave numerical simulations. These ERD layers with the appropriate complex permittivity are included in the modeling of strip line examples. The parameters of an ambient laminate dielectric refined from conductor roughness in the strip line are determined using differential extrapolation roughness measurement technique. The agreement of the results of 3-D full-wave modeling simulations and measurements on multiple test structures justifies the proposed approach. Based on the extracted ERD parameters 'design curves' can be built and used in numerical simulations of PCB high-speed designs.
Recommended Citation
M. Koledintseva et al., "Method Of Effective Roughness Dielectric In A PCB: Measurement And Full-Wave Simulation Verification," IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 4, pp. 807 - 814, article no. 7086038, Institute of Electrical and Electronics Engineers, Aug 2015.
The definitive version is available at https://doi.org/10.1109/TEMC.2015.2412113
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric measurements; numerical analysis; printed circuit fabrication; rough surfaces; stripline
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Aug 2015
