Direct observation of waveguided scattered light in multilayer dielectric thin films
Abstract
When a focused laser beam falls on a multilayer thin-film coating, light is scattered from the volume over which the beam intersects the coating. Some of the light may be scattered into directions that correspond to guided modes of the thin-film structure. We report the observation of scattered light at locations removed from the region of incidence of the light on the coating, resulting from the secondary scatter of the guided scattered light. The shape of the pattern observed by secondary scatter clearly resembles the pattern expected for Rayleigh scatter from a point source. This observation has important implications for the design of scatter-measuring instruments as well as for the theoretical treatment of scatter from multilayer coatings. © 1993 Optical Society of America.
Recommended Citation
C. K. Carniglia et al., "Direct observation of waveguided scattered light in multilayer dielectric thin films," Applied Optics, vol. 32, no. 28, pp. 5504 - 5510, Optica, Jan 1993.
The definitive version is available at https://doi.org/10.1364/AO.32.005504
Department(s)
Electrical and Computer Engineering
International Standard Serial Number (ISSN)
2155-3165; 1559-128X
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Optica, All rights reserved.
Publication Date
01 Jan 1993
