Abstract

Curves and equations are presented from which the exact performance of truncated sequential tests can be determined for one important case: the biased square-law detector for the detection of rapidly fading targets. The method of generating functions is used to derive probability distributions for sample size. It is shown how these probability distributions can be used to determine truncation errors and the effects of multiple-resolution elements. Sample calculations are performed to determine the effects of a particular truncation procedure. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.

Department(s)

Electrical and Computer Engineering

International Standard Serial Number (ISSN)

0018-9251

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 1968

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