An Impedance Converter-Based Probe Characterization Method for Magnetic Materials Loss Measurement
Abstract
As an essential component in power applications, magnetic cores and their design play an important role in achieving high efficiency and high power density. Accurate measurement of the core loss is important for inductor and power converter optimization. Loss measurement depends on exactly determining the phase angle between the voltage and the current. However, measurement errors can be introduced due to the discrepancies in propagation delays in the voltage and current sensors. In addition, the propagation delay is frequency dependent, but has a large influence in the MHz range and above. Previously, several methods have been proposed to compensate for this discrepancy but they are time consuming and can result in large measurement errors. In this paper, a characterization method for core loss based on a vector network analyzer and an impedance converter is proposed to accurately measure the phase discrepancies between voltage and current sensors. The proposed method is experimentally verified up to 15 MHz with a three-coil test setup.
Recommended Citation
A. Huang et al., "An Impedance Converter-Based Probe Characterization Method for Magnetic Materials Loss Measurement," IEEE Journal of Emerging and Selected Topics in Power Electronics, Institute of Electrical and Electronics Engineers (IEEE), Oct 2021.
The definitive version is available at https://doi.org/10.1109/JESTPE.2021.3119558
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Publication Status
Early Access
Keywords and Phrases
Core Loss; Core Loss Characterization; Current Measurement; Impedance; Impedance Converter; Loss Measurement; Phase Discrepancy; Probes; Propagation Delay; VNA; Voltage Measurement
International Standard Serial Number (ISSN)
2168-6785; 2168-6777
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
14 Oct 2021