A Decision Tree Approach for Subcircuit Extraction Problem

Abstract

The layout versus schematic (LVS) analysis is an essential part of topology design verification, and subcircuit extraction is one of the operations in the LVS testing. We provided an efficient decision tree approach to the subcircuit extraction problem based on the solution to the graph isomorphism problem. We construct the decision tree for the pattern circuit and the main circuit. And then we perform a classification process. To evaluate its performance, we compare it with the neural networks based heuristic dynamic programming algorithm (SubHDP) which is by far one of the fastest algorithms for subcircuit extraction problem.

Department(s)

Electrical and Computer Engineering

Sponsor(s)

Mary K. Finley Missouri Endowment
National Science Foundation (U.S.)

Keywords and Phrases

VLSI Layout Verification; Adaptive Critic Designs; Decision Tree; Layout Versus Schematic (LVS); Neural Networks

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2003 American Society of Mechanical Engineers (ASME), All rights reserved.

Publication Date

01 Jan 2003

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