Dielectric Constant Extraction for Microstrip Transmission Lines based on S-Parameter Measurements and Cross-Section

Abstract

In this paper, a new dielectric constant extraction method for the microstrip substrate material is proposed, which is based on measured S-parameter and cross-section analysis of the transmission lines. The calculation process is detailed and application examples are given. The phase constant is calculated from the measured S-parameters. By analyzing the cross-section geometry using a 2D solver, the per-unit-length inductance and capacitance of the air-filled line are obtained. Then using analytical expressions, the dielectric constant of the substrate is extracted from the effective dielectric constant. Comparing to the published method that requires knowing the characteristic impedance of the line, the new method will introduce less error to the extraction procedure and will provide more accurate results.

Meeting Name

2021 IEEE International Joint Electromagnetic Compatibility Signal and Power Integrity and EMC Europe Symposium, EMC/SI/PI/EMC Europe 2021 (2021: Jul. 26-Aug. 13, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Dielectric Constant Extraction; Microstrip; Printed Circuit Board; S-Parameter; Transmission Line

International Standard Book Number (ISBN)

978-166544888-8

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

13 Aug 2021

Link to Full Text

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