Prepreg and Core Dielectric Permittivity (εᵣ) Extraction for Fabricated Stripline' Far-End Crosstalk Modeling

Author

Shaohui Yong
Srinath Penugonda
DongHyun Kim, Missouri University of Science and TechnologyFollow
Victor Khilkevich, Missouri University of Science and TechnologyFollow
Bo Pu
Xiaoning Ye
Qian Gao
Xiao Ding Cai
Bidyut Sen
Jun Fan, Missouri University of Science and TechnologyFollow

Abstract

As the data rate and density of digital high-speed systems are getting higher, far-end crosstalk (FEXT) noise becomes one of the major issues that limit signal integrity performance. It was commonly believed that FEXT would be eliminated for striplines routed in a homogeneous dielectric, but in reality, FEXT can always be measured in striplines on the fabricated printed circuit boards. A slightly different dielectric permittivity (ε_r) of prepreg and core may be one of the major contributors to the FEXT. This article is focusing on providing a practical FEXT modeling methodology for striplines by introducing an approach to extract ε_r of prepreg and core. Using the known cross-sectional geometry and measured S-parameters of the coupled stripline, the capacitance components in prepreg and core are separated using a two-dimensional solver, and the ε_r of prepreg and core is determined. A more comprehensive FEXT modeling approach is proposed by applying extracted inhomogeneous dielectric material information.

Recommended Citation

S. Yong and S. Penugonda and D. Kim and V. Khilkevich and B. Pu and X. Ye and Q. Gao and X. D. Cai and B. Sen and J. Fan, "Prepreg and Core Dielectric Permittivity (εᵣ) Extraction for Fabricated Stripline' Far-End Crosstalk Modeling," IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers (IEEE), Jun 2021.

The definitive version is available at https://doi.org/10.1109/TEMC.2021.3083771

Department(s)

Electrical and Computer Engineering

Publication Status

Early Access

Keywords and Phrases

Capacitance; Conductors; Dielectric Material; Dielectric Materials; Dielectrics; Far-End Crosstalk (FEXT); Nonhomogeneous Media; Permittivity Measurement; Stripline; Stripline; Transmission-Line Theory

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

10 Jun 2021