S-Parameter De-Embedding Error Estimation based on the Statistical Circuit Models of Fixtures

Author

Yuanzhuo Liu
Shaohui Yong
Han Gao, Cisco Systems
Scott Hinaga, Cisco Systems
Darja Padilla
Douglas Yangawa
James L. Drewniak, Missouri University of Science and TechnologyFollow
Victor Khilkevich, Missouri University of Science and TechnologyFollow

Abstract

S-parameter de-embedding methods require multiple fixtures to be identical. However, due to manufacturing variations, the fixtures are never perfectly identical, which violates the assumptions for the de-embedding algorithms and, in turn, introduces errors. In this article, a novel methodology is proposed to estimate the errors due to de-embedding for practical transmission line measurements. The circuit models of the thru and total lines with fixtures are created. Perturbation in the fixtures is introduced based on the fixture variation estimated by time-domain reflectometry measurements. The method can predict the envelope and estimate the confidence interval of the de-embedded insertion loss using a limited number of simulation cases.

Recommended Citation

Y. Liu et al., "S-Parameter De-Embedding Error Estimation based on the Statistical Circuit Models of Fixtures," IEEE Transactions on Electromagnetic Compatibility, vol. 62, no. 4, pp. 1459 - 1467, Institute of Electrical and Electronics Engineers (IEEE), Jun 2020.

The definitive version is available at https://doi.org/10.1109/TEMC.2020.2992553

Department(s)

Electrical and Computer Engineering

Comments

National Science Foundation, Grant IIP-1440110

Keywords and Phrases

2X-Thru; Confidence Interval; De-Embedding; Error Analysis; Fixtures; Thru-Reflect-Line (TRL); Transmission Line Measurements

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jun 2020