Trend Analysis of Dissipated Electrostatic Discharge Energy in Touchscreen Displays
Abstract
Touchscreen displays can be susceptible to sparkless electrostatic discharge events. The energy observed by sensitive touchscreen circuitry can vary significantly with design parameters like the glass thickness, the capacitance between the sensor pad and the ground structure, and the resistance of the traces and sensor terminations connected to the pad. The energy dissipated in resistive structures within the display can lead to damage. Methods are presented to estimate the maximum energy dissipated in the touchscreen circuitry during a spark-less discharge to the display. The trends in the energy with variations in design parameters are analyzed using traditional curve-fitting techniques. The analysis was performed using measured data obtained for 20 touchscreen configurations when the ESD gun was charged to 9 kV and 15 kV. The analysis helps the designer to understand the trends and to predict how future design decisions may impact ESD susceptibility. Results suggest that immunity can be maximized by increasing the glass thickness, reducing the load resistance, and reducing the distance between the sensor pad and the PCB return plane.
Recommended Citation
Z. Peng et al., "Trend Analysis of Dissipated Electrostatic Discharge Energy in Touchscreen Displays," Proceedings of the 2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, pp. 188 - 193, Institute of Electrical and Electronics Engineers (IEEE), Sep 2020.
The definitive version is available at https://doi.org/10.1109/EMCSI38923.2020.9191579
Meeting Name
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, EMCSI 2020 (2020: Jul. 27-31, Virtual)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electro-Static Discharge (ESD); Energy; Measurement-Based; Sparkless Discharge; Touchscreen; Trend Analysis
International Standard Book Number (ISBN)
978-172817430-3
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
10 Sep 2020