Title

Race Conditions among Protection Devices for a High Speed I/O Interface

Abstract

The ESD coupling path and on-board impedances strongly affect the ESD rise time seen on a PCB trace. Possible race conditions between external and on-die ESD protection were studied using measurement-based models of the transient response and on-board passives. Results show the interplay of rise time and protection turn-on can prevent the external TVS from responding in time.

Meeting Name

42nd Annual EOS/ESD Symposium (2020: Sep. 13-18, Reno, NV)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Comments

National Science Foundation, Grant IIP-1916535

International Standard Book Number (ISBN)

978-172819461-5

International Standard Serial Number (ISSN)

0739-5159

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

10 Nov 2020

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