Passive Intermodulation Source Localization based on Emission Source Microscopy

Abstract

Emission source microscopy (ESM) technique can be used for localization and characterization of electromagnetic interference sources by measuring the magnitude and phase of the electromagnetic field in the far-field zone. This article presents a method which uses ESM to locate sources of passive intermodulation (PIM). Compared to the traditional methods of PIM source localization techniques including mechanical manipulation of potential sources and near-field scanning, the proposed ESM-based approach does not require access to the devices under test allowing to detect the PIM sources at relatively large distances. Moreover, the influence of background PIM generated by surrounding environment can be reduced by ESM focusing. The high-quality maps of reconstructed PIM sources can be obtained by using ESM. The feasibility of manual sparse ESM scanning, which is more practical in realistic settings is also demonstrated.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Base Station Antennas; Emission Source Microscopy (ESM); Passive Intermodulation (PIM)

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Feb 2020

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