A Practical De-Embedding Error Analysis Method based on Statistical Circuit Models of Fixtures
Abstract
De-embedding methods require multiple identical fixtures. However, in reality the fixtures cannot be fabricated perfectly identical due to manufacturing variations. The identical assumptions for de-embedding algorithm will be unavoidably violated, which is going to introduce error due to de-embedding. In this paper, a novel methodology is proposed to estimate the error due to de-embedding for practical testing vehicle measurement. Models of the Thru and Total lines with fixtures are created. Perturbation in the fixtures is introduced based on TDR measurements. The confidence interval of the de-embedded insertion loss is obtained after statistical analysis assuming the variations among fixtures are subjected to Gaussian distribution.
Recommended Citation
S. Yong et al., "A Practical De-Embedding Error Analysis Method based on Statistical Circuit Models of Fixtures," Proceedings of the 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2019, New Orleans, LA), pp. 45 - 50, Institute of Electrical and Electronics Engineers (IEEE), Jul 2019.
The definitive version is available at https://doi.org/10.1109/ISEMC.2019.8825291
Meeting Name
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 (2019: Jul. 22-26, New Orleans, LA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
2X-Thru; De-Embedding; Statistical Simulation; Transmission Line Measurements; TRL
International Standard Book Number (ISBN)
978-153869199-1
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2019
