A Method to Extract Physical Dipoles for Radiating Source Characterization and Near Field Coupling Estimation
Infinitesimal electric and magnetic dipoles are widely used as an equivalent radiating source model in far field radiated emissions and near field coupling scenarios. In this paper, a hybrid method for physical dipole extraction based on genetic algorithm and linear least square method is proposed. It offers an automatic flow to extract the equivalent dipoles without prior decision of the type, position, orientation and number of dipoles. Compared with conventional linear least square method, this algorithm can extract physical dipoles which are close to original radiating source and minimize the number of dipoles. Compared with conventional genetic algorithm based method, this method reduces the optimization time and is more robust. This method is validated by both simulation and measurement data, and its advantages are proved. It is applied to modeling of the radiation from a clock buffer chip. The extracted equivalent dipoles are used to estimate the near field coupling from the clock buffer chip to a victim inverted F antenna (IFA) in a practical printed circuit board (PCB) by full wave simulation. The estimation matches well with measurement.
C. Wu et al., "A Method to Extract Physical Dipoles for Radiating Source Characterization and Near Field Coupling Estimation," Proceedings of the 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2019, New Orleans, LA), pp. 580-583, Institute of Electrical and Electronics Engineers (IEEE), Jul 2019.
The definitive version is available at https://doi.org/10.1109/ISEMC.2019.8825214
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 (2019: Jul. 22-26, New Orleans, LA)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic Coupling; Equivalent Radiating Source Model; Near Field Coupling; Near-Field Scanning; Numerical Modeling
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jul 2019