Differential S-Parameter De-Embedding for 8-Port Network
Abstract
Compared to 4-port de-embedding, 8-port de-embedding is much more challenging due to the presence of crosstalk terms in both the differential mode and the common mode. Using the 2nd order mixed-mode concept, this work proposes an 8-port smart fixture de-embedding (SFD) method. The proposed method neglects modal conversion terms by requiring balanced and symmetrical designs. Analysis showed that this approximation generally has negligible impact on the de-embedded differential results with careful test fixture design.
Recommended Citation
B. Chen et al., "Differential S-Parameter De-Embedding for 8-Port Network," Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA), Institute of Electrical and Electronics Engineers (IEEE), Jul 2018.
The definitive version is available at https://doi.org/10.1109/EMCSI.2018.8495340
Meeting Name
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 (2018: Jul. 30-Aug. 3, Long Beach, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Busbars; Crosstalk; Electromagnetic compatibility; Fixtures (tooling); 2X-Thru; De-embedding; FEXT; Mixed mode; NEXT; Test fixture; Scattering parameters; 1st order mixed- mode; 2nd order mixed-mode; 8-port network; SFD
International Standard Book Number (ISBN)
978-1-5386-6621-0
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2018
Comments
This material is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110. The authors would like to acknowledge Dr. Se-Jung Moon for providing the S parameters of the PCB test fixture for the study. The authors would like to thank Mr. Nicholas Erickson for his careful review of the manuscript.