An Investigation of Electromagnetic Radiated Emissions from Wireless Charging System for Mobile Device using Qi Standard
Abstract
In this paper, the electromagnetic radiated emissions from 30 MHz to 1 GHz of a wireless charging system for a mobile device using Qi standard are investigated. It has been found that the common mode current on USB cable is the main cause of radiation and the noise source is the full bridge inverter in power transmitter. The common mode current path is highlighted to explain the radiation mechanism. The switch node voltage in time domain and frequency domain are measured for more understanding of noise source. A full wave simulation model is built to roughly estimate the far field radiation. Methods to reduce the radiated emissions are also discussed and demonstrated experimentally.
Recommended Citation
C. Wu et al., "An Investigation of Electromagnetic Radiated Emissions from Wireless Charging System for Mobile Device using Qi Standard," Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA), pp. 483 - 488, Institute of Electrical and Electronics Engineers (IEEE), Jul 2018.
The definitive version is available at https://doi.org/10.1109/EMCSI.2018.8495249
Meeting Name
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 (2018: Jul. 30-Aug. 3, Long Beach, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Busbars; Energy transfer; Ferrite; Frequency domain analysis; Inductive power transmission; Common mode currents; Far-field radiation; Full-bridge inverters; Full-wave simulations; Radiated emissions; Wireless charging; Wireless charging system; Wireless power transfer; Electromagnetic compatibility; Common-mode current; Qi standard; Radiated emissions
International Standard Book Number (ISBN)
978-1-5386-6621-0
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2018