Statistical Eye-Diagram Estimation Method for High-Speed Channel with N-Tap Decision Feedback Equalizer (DFE)
Abstract
In this paper, we propose a statistical eye-diagram estimation method for a high-speed channel including N-tap decision feedback equalizer (DFE). This paper proposes a behavior model for the DFE to replace the DFE in the proposed method. The proposed behavior model fully describes the N-tap DFE, which results in successful eye-diagram estimation with the N-tap DFE. In order to show the effect of the DFE depending on its coefficients, this paper shows the corresponding estimated eye-diagrams. For further analysis on the DFE, we also conducted parametric sweep on the coefficient with the proposed method. For verification, we provide a transient simulation under the same condition. From the comparison, the estimated and simulated eye-diagrams are nearly the same. Therefore, this paper successfully proposes and verifies the statistical eye-diagram estimation method with the N-tap DFE for high-speed serial channels.
Recommended Citation
J. Park et al., "Statistical Eye-Diagram Estimation Method for High-Speed Channel with N-Tap Decision Feedback Equalizer (DFE)," Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore), pp. 1027 - 1032, Institute of Electrical and Electronics Engineers (IEEE), May 2018.
The definitive version is available at https://doi.org/10.1109/ISEMC.2018.8393941
Meeting Name
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (2018: May 14-18, Singapore)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Decision feedback equalizer (DFE); Eye-Diagram Estimation; High-Speed Channel; N-tap DFE; Signal integirty (SI); Single bit response (SBR)
International Standard Book Number (ISBN)
978-150905997-3
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2018