Noise Coupling Analysis from High Voltage Capacitor Discharging Circuit in an Electronic Safety and Arming Device
Abstract
An electronic safety and arming (ESAD) system has a capacitor discharging circuit (CDC) to detonate a fuse. The CDC uses over thousands voltage to ensure the reliability of detonation. When a capacitor of CDC is discharged, a very high and broadband current discharged from the CDC causes noise coupling to noise-sensitive peripheral circuits. Therefore, in order to guarantee operational reliability of the ESAD, it is necessary to analyze noise coupling from the high current generated by the CDC. In this paper, we analyze noise coupling in the ESAD system. Noise coupling paths between CDC and trigger circuit are analyzed with full wave 3D-electromagnetic (EM) simulation. Also, simulation in the time domain is conducted to verify the voltage noise induced on the trigger circuit. We propose two ground designs to suppress noise coupling from the CDC. The effectiveness of the different ground designs is compared with time domain simulation. As a result, the proposed ground designs suppress the voltage noise induced on the trigger circuit up to 56 %.
Recommended Citation
H. Kang et al., "Noise Coupling Analysis from High Voltage Capacitor Discharging Circuit in an Electronic Safety and Arming Device," Proceedings of the 2018 IEEE Electrical Design of Advanced Packaging and Systems Symposium (2018, Chandigarh India), Institute of Electrical and Electronics Engineers (IEEE), Dec 2019.
The definitive version is available at https://doi.org/10.1109/EDAPS.2018.8680901
Meeting Name
2018 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2018 (2018: Dec. 16-18, Chandigarh India)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electronic safety and arming device; Noise coupling; Noise suppression; Transfer impedance
International Standard Book Number (ISBN)
978-153866592-3
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Dec 2019