The Advantages of the RTS Method in MIMO OTA Measurements
Abstract
This paper proposed a radiated two-stage based method for the Multiple Input Multiple Output (MIMO) system evaluations. By using the proposed method, not only the final throughput values, but also the antenna patterns, the antennas' envelope correlation coefficient, the antennas' imbalance and the radiated sensitivity of the MIMO device can be obtained over the air. Moreover, through these parameters, the antenna performance and the radio frequency circuit performance can be investigated individually, which is significant for engineers to find out the imperfections and to improve the design qualities. All in all, this method is valuable for research and development for MIMO devices.
Recommended Citation
P. Shen et al., "The Advantages of the RTS Method in MIMO OTA Measurements," Proceedings of the 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017, Washington, DC), pp. 470 - 473, Institute of Electrical and Electronics Engineers (IEEE), Aug 2017.
The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8077916
Meeting Name
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, EMCSI (2017: Aug. 7-11, Washington, DC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Codes (symbols); Directional patterns (antenna); Electromagnetic compatibility; Feedback control; Telecommunication repeaters; Antenna performance; Design Quality; Envelope correlation coefficient; Over the air (OTA); Radio frequency circuit; Research and development; MIMO systems; Multiple Input Multiple Output (MIMO); Radiated two-stage
International Standard Book Number (ISBN)
978-1-5386-2229-2
International Standard Serial Number (ISSN)
2158-1118
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2017