Source Reconstruction for IC Radiated Emissions Based on Magnitude-Only Near-Field Scanning
Near-field scanning with phase measurement is always a challenge in practical experiments because of its complexity and lack of accuracy. Therefore, utilizing the magnitude-only information to achieve phase-retrieval and emissions source reconstruction is preferred. This paper proposes a fast and accurate algorithm that can model the emissions from ICs by generating a set of equivalent dipole elements. The process of this algorithm only requires the information of the field magnitudes on two near-field scanning planes of different heights. Unlike other conventional source reconstruction techniques (such as genetic algorithm, gradient optimization), the proposed approach iteratively performs the back-and-forth transformations among the fields and equivalent dipole elements. By optimizing the locations of the equivalent dipole array and the initial values of these dipole elements, the iteration process is capable of quickly converging to the correct electromagnetic field values, including both magnitude and phase. The fields recovered from the calculated equivalent dipole sources have been validated by comparing to the fields emitted from a practical IC source.
J. Zhang and J. Fan, "Source Reconstruction for IC Radiated Emissions Based on Magnitude-Only Near-Field Scanning," IEEE Transactions on Electromagnetic Compatibility, vol. 59, no. 2, pp. 557-566, Institute of Electrical and Electronics Engineers (IEEE), Apr 2017.
The definitive version is available at https://doi.org/10.1109/TEMC.2016.2638760
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
National Science Foundation (U.S.)
Keywords and Phrases
Dipole antennas; Electromagnetic fields; Genetic algorithms; Integrated circuits; Optimization; Scanning; Timing circuits; Different heights; Fast and accurate algorithms; Gradient optimization; Iteration process; Near-field scanning; Radiated emissions; Source reconstruction; Equivalent dipole elements; IC emissions; Iteration algorithm
International Standard Serial Number (ISSN)
Article - Journal
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Apr 2017