Objective Total Isotropic Sensitivity Measurement


The characterization of the performance of wireless devices plays a significant role in developing radio products that meet the demands of the latest standards and deliver a satisfying user experience. With current standard total isotropic sensitivity (TIS) measurement, the transmitters are set to work at their maximum transmission power level. However, the standard TIS test procedure is unable to accurately reflect a receiver's performance because in actual usage transmitters are rarely working at their maximum power level. In measurements, different kinds of devices hold different maximum power levels. The measured radio sensitivity depends on the instantaneous local temperature of the radio, and the local temperature depends on the heat generation (power levels), the heat dissipation, and time. So the power levels and the thermal conditions could affect their radio sensitivity and, hence, the TIS. With standard TIS methods, the maximum power level and the radio's thermal condition cause ambiguity in the measurements. However, this paper proposes a new objective TIS method. With this new TIS method, the measured TIS is a function of the transmitter power level at its thermally stable condition. The proposed method resolves the ambiguity of the TIS measurement.


Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Artificial intelligence; Testing; Transmitters; Local temperature; Thermal condition; Thermally stable; Total isotropic sensitivities (TIS); Transmission power levels; Transmitter power; User experience; Wireless devices; Electric power transmission; Desensitization; Effective isotropic radiated power; Effective isotropic sensitivity (EIS) radio transmitter power; Electromagnetic interference (EMI) and electromagnetic compatibility (EMC); Over-the-air (OTA); Radio sensitivity

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version


File Type





© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Dec 2017