EMC Fundamentals - ESD
Abstract
Charge separation leads to high voltages, walking, sitting up from a chair and removing a sweater are typical situations Removing a sweater can easily lead to 20kV in dry air System level ESD testing is based on the human-metal ESD ESD testing can be performed in contact and air discharge mode. Contact mode must be applied to conductive surfaces. Failures can be caused by current and by fields. Most damage is caused by current, except, fields can also cause latch up. In most cases TVS are the right choices for overvoltage protection. Soft failure root cause analysis can be performed using local scanning, locally injecting fields from a fast (< 1ns) rise time pulse generator.
Recommended Citation
D. Pommerenke, "EMC Fundamentals - ESD," Proceedings of the 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017, Washington, DC), Institute of Electrical and Electronics Engineers (IEEE), Aug 2017.
The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8078092
Meeting Name
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017: Aug. 7-11, Washington, DC)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electric Discharges; Electric Equipment Protection; Electrostatic Devices; Electrostatic Discharge; Metal Testing; Overvoltage Protection; Surge Protection; Air Discharge; Charge Separations; Conductive Surfaces; Contact Modes; High Voltage; Latch-ups; Risetimes; Soft Failure; Electromagnetic Compatibility
International Standard Book Number (ISBN)
978-1-5386-2231-5; 978-1-5386-2229-2
International Standard Serial Number (ISSN)
2158-1118
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2017