Differential Integrated Crosstalk Noise (ICN) Reduction among Multiple Differential BGA and Via Pairs by using Design of Experiments (DoE) Method
Abstract
The integrated crosstalk noise (ICN) has been wildly used as an alternative to the insertion crosstalk ratio (ICR) for channel crosstalk evaluation in the IEEE 802.3ba standard. In this work, a differential ICN analysis is performed for several configurations of package-to-PCB transitions. Using the design of experiment (DoE) statistical method, differential ICN is quickly estimated for various input factors such as pin mapping, physical dimensions, and level of shielding. Optimization guide line is proposed to maintain the tradeoff among the differential ICN, design space, and manufacturing cost.
Recommended Citation
B. Chen et al., "Differential Integrated Crosstalk Noise (ICN) Reduction among Multiple Differential BGA and Via Pairs by using Design of Experiments (DoE) Method," Proceedings of the 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017, Washington, DC), pp. 112 - 117, Institute of Electrical and Electronics Engineers (IEEE), Aug 2017.
The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8077851
Meeting Name
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, EMCSI (2017: Aug. 7-11, Washington, DC)
Department(s)
Electrical and Computer Engineering
Sponsor(s)
National Science Foundation (U.S.)
Keywords and Phrases
Ball grid arrays; Crosstalk; Design of experiments; Electromagnetic compatibility; Electromagnetic shielding; Polychlorinated biphenyls; Channel crosstalk; Crosstalk noise; Crosstalk ratio; Design spaces; Fan Out; Input factors; Manufacturing cost; Physical dimensions; Analysis of variance (ANOVA); DoE; Dog bone fan-out; FFD; ICN; Via-in-pad fan-out
International Standard Book Number (ISBN)
978-1-5386-2229-2
International Standard Serial Number (ISSN)
1077-4076; 2158-1118
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2017
Comments
This material is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.