Coplanar Intermodulation Reference Generator using Substrate Integrated Waveguide with Integrated Artificial Nonlinear Dipole
Abstract
An intermodulation (IM) generator based on substrate integrated waveguide (SIW) is demonstrated. This generator has maximal 80 dB dynamic range with a size that is smaller than 65 mm x 40 mm x 1.5 mm. A biased Schottky diode is mounted onto the slotted plane of SIW and it consists of a nonlinear dipole to radiate nonlinear signal to the carrier domain and serve as reference signal. A polarized slot helps focus the linear carrier wave onto the diode and construct a bias-controlled IM distortion. The experiment proves that this device can generate the IM3 reference ranges from −112 to −32 dBm at 2 x 43 dBm, while its minimum step can reach lesser than 0.5 dB. This proposed device can serve as tunable IM standards in PIM test and calibrate the commercial PIM tester.
Recommended Citation
X. Chen et al., "Coplanar Intermodulation Reference Generator using Substrate Integrated Waveguide with Integrated Artificial Nonlinear Dipole," IEEE Transactions on Electromagnetic Compatibility, vol. 61, no. 3, pp. 969 - 972, Institute of Electrical and Electronics Engineers (IEEE), Jun 2019.
The definitive version is available at https://doi.org/10.1109/TEMC.2018.2849965
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Calibration; Couplings; Diodes; Gas generators; Intermodulation distortion; Schottky barrier diodes; Surface waves; Van de Graaff generators; Electromagnetic waveguides; Nonlinear dipoles; Passive intermodulation; Schottky diodes; Slot coupling; Surface impedances; Substrate integrated waveguides; Generators; Passive intermodulation (PIM); Substrate integrated waveguide (SIW); Surface impedance
International Standard Serial Number (ISSN)
0018-9375; 1558-187X
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jun 2019