Network Model of Electronic States of Thin Films, Solid Interfaces, and Planar Defects
Green's functions for a finite free boundary network are derived. Their application to models of solid interface and surface defects is made. The density of states with respect to localized electrons around interface or defect nodes is calculated. The density of states as a function of the thickness of a thin film is calculated. Periodic conditions as well as free surface boundaries are considered.
C. Wu and E. W. Montroll, "Network Model of Electronic States of Thin Films, Solid Interfaces, and Planar Defects," Journal of Nonmetals and Semiconductors, vol. 2, no. 3, pp. 153-191, Taylor & Francis, Oct 1975.
Electrical and Computer Engineering
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© 1975 Taylor & Francis, All rights reserved.
01 Oct 1975