Network Model of Electronic States of Thin Films, Solid Interfaces, and Planar Defects

Abstract

Green's functions for a finite free boundary network are derived. Their application to models of solid interface and surface defects is made. The density of states with respect to localized electrons around interface or defect nodes is calculated. The density of states as a function of the thickness of a thin film is calculated. Periodic conditions as well as free surface boundaries are considered.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Films; Crystals

International Standard Serial Number (ISSN)

0140-1653

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1975 Taylor & Francis, All rights reserved.

Publication Date

01 Oct 1975

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