Electron Transport Through Complex Ultra-Thin Wired Networks
Abstract
In our work here, we made the first attempt of investigating the electron transmission through a network involving complex loops. When two Aharonov-Bohm rings are brought together to form a complex network, the anti-bonding picture allows electron to circulate only on the small loop and bonding picture allows the electron to circulate on the large combined loop. When an electron spreads a part of the wave in the bonding picture and a part of the wave in the anti-bonding picture, the splitting of the wave causes the electron to behave like a "fractional" charge. Similar to fractional hall effect this fractional charge is manifested in the flux periodicity from the two applied fluxes in the loops and is thus experimentally observable. The transmission behaviors through reducible and irreducible double Aharonov-Bohm loops are presented here. The applications of this new electron-wave computing method by quantum resister network will be shown as a possible new direction for the future computing technology.
Recommended Citation
E. D. Maje and C. Wu, "Electron Transport Through Complex Ultra-Thin Wired Networks," Proceedings of the 2004 IEEE Africon. 7th Africon Conference in Africa (2004, Gaborone, Botswana, Africa), vol. 1, pp. 531 - 535, Institute of Electrical and Electronics Engineers (IEEE), Sep 2004.
The definitive version is available at https://doi.org/10.1109/AFRICON.2004.1406734
Meeting Name
2004 IEEE Africon. 7th Africon Conference in Africa (2004, Sep. 15-17, Gaborone, Botswana, Africa)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electron transmission; Electron wave computing; Fractional charges; Nano-wired networks; Quantum resistor network; Digital circuits; Large scale systems; Magnetic flux; Microelectronics; Quantum theory; Resistors; Transistors; Wire; Electron transport properties; Electron transport
International Standard Book Number (ISBN)
0-7803-8605-1
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Sep 2004