Robustness of Mobile Ad Hoc Networks under Centrality-based Attacks
Abstract
In order to understand the role of critical nodes in mobile ad hoc networks (MANETs), dynamic topologies are modelled as time-varying graphs and network topologies within a certain time window are aggregated as a weighted static graph. Critical node behaviour has been previously studied by evaluating how end-to-end throughput is impacted by the removal of high centrality nodes. However, different routing and transport protocols used between physical and application layers can also affect end-to-end network performance. In this paper, instead of analysing networks that span multiple layers, we focus on the routing-topology level based on synthetic mobility traces. We examine how attacks based on different centrality metrics impact robustness, connectivity, and stability of the mobile networks with different parameters. Our results demonstrate that the betweenness centrality is a relatively accurate centrality metric to indicate node significance in a well-connected multihop ad hoc network.
Recommended Citation
D. Zhang et al., "Robustness of Mobile Ad Hoc Networks under Centrality-based Attacks," Proceedings of the 2013 5th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops, ICUMT 2013, pp. 229 - 235, Institute of Electrical and Electronics Engineers (IEEE), Jan 2013.
The definitive version is available at https://doi.org/10.1109/ICUMT.2013.6798431
Meeting Name
2013 5th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops, ICUMT 2013 (2013: Sep.10-12, Almaty, Kazakhstan)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Ad Hoc Networks; Control Systems; Electric Network Topology; Graph Theory; Robustness (Control Systems); Telecommunication Networks; Centrality; Disruption Tolerant Networks; Dynamic Topologies; MANET; Weighted Graph; Mobile Ad Hoc Networks
International Standard Book Number (ISBN)
978-1479911776
International Standard Serial Number (ISSN)
2157-0221
Electronic OCLC #
892190619
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2013