Improved Technique for Extracting Parameters of Low-Loss Dielectrics on Printed Circuit Boards
The paper is devoted to a methodology and an improved technique of characterization of low-loss dielectrics on printed circuit boards. The technique is based on measuring S-parameters and recalculating them into complex propagation constant. Phase correction is proposed to assure that the phase constant passes through zero at zero frequency. An effect of dielectric loss upon a dielectric constant is considered in the analytical model for dielectric parameter extraction. Dielectric and conductor losses are separated using a model, which includes surface roughness of conductors. Network asymmetry is taken into account in the model. Extracted parameters for frequency-dispersive dielectrics satisfy Kramers-Krönig causality relations. The proposed model allows for extracting dielectric constant and dissipation factor with an increased accuracy.
A. Koul et al., "Improved Technique for Extracting Parameters of Low-Loss Dielectrics on Printed Circuit Boards," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, Austin, TX), pp. 191 - 196, Institute of Electrical and Electronics Engineers (IEEE), Aug 2009.
The definitive version is available at https://doi.org/10.1109/ISEMC.2009.5284646
IEEE International Symposium on Electromagnetic Compatibility (2009: Aug. 17-21, Austin, TX)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Analytical Model; Conductor Loss; Dielectric Constants; Dielectric Parameter Extraction; Dispersive Dielectrics; Dissipation Factors; Extracting Parameter; Low Loss; Phase Constants; Phase Corrections; Propagation Constant; S-Parameters; Zero Frequency; Dielectric Losses; Electromagnetic Compatibility; Parameter Extraction; Permittivity; Plastic Molds; Printed Circuit Boards; Printed Circuit Manufacture; Scattering Parameters; Surface Roughness; Dielectric Materials
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Article - Conference proceedings
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2009