Characterizing EMI Radiation Physics for Edge- and Broad-Side Coupled Connectors

Author

Ying S. Cao
Xu Wang
Wending Mai
Yansheng Wang
Li Jun Jiang
Albert E. Ruehli, Missouri University of Science and TechnologyFollow
Shiquan He
Huapeng Zhao
Jun Hu
Jun Fan, Missouri University of Science and TechnologyFollow
James L. Drewniak, Missouri University of Science and TechnologyFollow

Abstract

Electromagnetic radiation for a printed circuit board (PCB) midplane connector is studied in this paper. By applying integral-equation (IE) based method and characteristic mode (CM) analysis, the current is split into radiating and non-radiating ones. The radiated power from each part of the structure can be quantified using the radiating current. Therefore, the radiation hot spot can be identified for both edge-side coupled and broad-side coupled connectors. Furthermore, the radiation characteristics for these connectors are compared.

Recommended Citation

Y. S. Cao and X. Wang and W. Mai and Y. Wang and L. J. Jiang and A. E. Ruehli and S. He and H. Zhao and J. Hu and J. Fan and J. L. Drewniak, "Characterizing EMI Radiation Physics for Edge- and Broad-Side Coupled Connectors," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2017, Washington, D.C.), pp. 766 - 771, Institute of Electrical and Electronics Engineers (IEEE), Aug 2017.

The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8077970

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2017: Aug. 7-11, Washington, DC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Sponsor(s)

National Science Foundation (U.S.)

Comments

This material is based upon work supported by the National Science Foundation under Grant No. IIP-1440110.

Keywords and Phrases

Connectors (Structural); Electromagnetic Compatibility; Electromagnetic Pulse; Electromagnetic Waves; Heat Radiation; Integral Equations; Signal Interference; Characteristic Modes; Hot Spot; Printed Circuit Boards (PCB); Radiated Power; Radiation Characteristics; Radiation Physics; Connectors; Electromagnetic Interference (EMI); Radiation

International Standard Book Number (ISBN)

978-1538622315; 978-1538622292

International Standard Serial Number (ISSN)

2158-1118

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2017