"Negative Reactance Impacts on the Eigenvalues of the Jacobian Matrix i" by Tao Ding, Cheng Li et al.
 

Negative Reactance Impacts on the Eigenvalues of the Jacobian Matrix in Power Flow and Type-1 Low-Voltage Power-Flow Solutions

Abstract

It was usually considered in power systems that power flow equations had multiple solutions and all the eigenvalues of Jacobian matrix at the high-voltage operable solution should have negative real parts. Accordingly, type-1 low-voltage power flow solutions are defined in the case that the Jacobian matrix has only one positive real-part eigenvalue. However, an important issue that has not been well addressed yet is that the 'negative reactance' may appear in the practical power system models. Thus, the negative real-part eigenvalues of the Jacobian matrix at the high-voltage operable solution may be positive and also the type-1 low-voltage solutions could have more than one positive real-part eigenvalues, being a major challenge. Therefore, in this paper, the recognition of the type-1 low-voltage power flow solutions is re-examined with the presence of negative reactance. Selected IEEE standard power system models and the real-world Polish power systems are then tested to verify the analysis. The results reveal that the negative reactance in the practical power systems has a significant impact on the negative real-part eigenvalues of the Jacobian matrix at the high-voltage operable solution as well as the number of positive real-part eigenvalues at the type-1 low-voltage power flow solutions.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Intelligent Systems Center

Keywords and Phrases

Eigenvalues and Eigenfunctions; Jacobian Matrices; Continuation Power Flow; Eigenvalues; Negative Reactance; Power Flows; Power-Flow Solution; Electric Load Flow; Power Flow; Type-1 Power Flow Solution

International Standard Serial Number (ISSN)

0885-8950

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2017

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