Calculation and Measurement of Transient Fields from Voluminous Objects
Abstract
Numerical methods for the calculation of transient fields from ESD have been published recently. The methods simplify the problem either by neglecting the arc or just calculating simple geometries. A complete solution would require the calculation of a lossy 3D nonlinear problem with numerically hard to handle dimension. Nevertheless, due to the nonlinearity of the arc, time domain methods are preferable. In this paper, numerical calculations of transient field from ESD have been studied. The influence of this approach on the static charge distribution and voltage is discussed. Results of a thin wire Method of Moments calculation are also presented, and the numerical method for the calculation of voluminous objects outlined.
Recommended Citation
R. S. Zaridze et al., "Calculation and Measurement of Transient Fields from Voluminous Objects," Proceedings of the Electrical Overstress/Electrostatic Discharge Symposium (1995, Phoenix, AZ), pp. 95 - 100, Institute of Electrical and Electronics Engineers (IEEE), Sep 1995.
The definitive version is available at https://doi.org/10.1109/EOSESD.1995.478273
Meeting Name
Electrical Overstress/Electrostatic Discharge Symposium (1995: Sep. 12-14, Phoenix, AZ)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Arc Model; Electrostatic Discharge; Numerical Calculations; Static Charge Distribution; Thin Wire Code; Transient Fields; Voltage; Voluminous Objects; Calculations; Electric Arcs; Electric Charge; Electric Currents; Electric Discharges; Electric Field Measurement; Electromagnetic Wave Scattering; Electrostatics; Estimation; Mathematical Models; Numerical Methods; Time Domain Analysis; Electric Fields
International Standard Book Number (ISBN)
1-878303-59-7
International Standard Serial Number (ISSN)
0739-5159
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1995 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Sep 1995