Study of the Impulsive Field Occurrence Rate and Intensity
Abstract
To design electrostatic discharge (ESD) robust equipment the occurrence rate and the intensity of the pulses must be known. The present ESD test levels are based on studies done in the early 80's. These studies used less than 100 MHz bandwidth, i.e. the most important part of an ESD, the initial peak was not seen. The existing current data on ESD is insufficient to access the severity of ESD. Most of the existing current data available on ESD is of questionable value, most measurement were made using untraceable measurement techniques. Beside these problems there is no user environment database at all on transient fields of ESD. To close that gap a new impulse monitoring system was designed. This system automatically detects ESD by the associated fields. The monitoring system records E and H field values, their peak derivatives and spectral distribution with more than 1 GHz bandwidth. Furthermore, environmental information (temperature and humidity) and time are recorded. The monitoring system is described. Methods for evaluation of the data are presented.
Recommended Citation
S. Frei and D. Pommerenke, "Study of the Impulsive Field Occurrence Rate and Intensity," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1997, Austin, TX), pp. 507 - 512, Institute of Electrical and Electronics Engineers (IEEE), Aug 1997.
The definitive version is available at https://doi.org/10.1109/ISEMC.1997.667733
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (1997: Aug. 18-22, Austin, TX)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Bandwidth; Electric Measuring Instruments; Electromagnetic Field Measurement; Electrostatics; Electrostatic Discharge (ESD); Impulse Monitoring Systems; Electric Discharges
International Standard Serial Number (ISSN)
0190-1494
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1997 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 1997