Methods for Speeding up Radiated and Conducted Immunity Tests
Different methods for reducing test time in immunity tests similar to IEC 61000-4-6 or IEC 61000-4-3 are compared. One option is to apply multiple signals at the same time. Hardware and software methods to create those signals are explained, limits and possible amplitude errors are discussed. Mode stirred chambers and methods which aim at substituting sinusoidal excitation by strong pulsed signals are not within the scope of this paper.
D. Pommerenke, "Methods for Speeding up Radiated and Conducted Immunity Tests," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, DC), vol. 2, pp. 587-592, Institute of Electrical and Electronics Engineers (IEEE), Aug 2000.
The definitive version is available at https://doi.org/10.1109/ISEMC.2000.874686
IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)
Electrical and Computer Engineering
Keywords and Phrases
Computer Hardware; Computer Software; Electric Machinery Testing; Pulse Circuits; Signal Processing; Time Domain Analysis; Immunity Tests; Sinusoidal Excitation; Electric Excitation
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2000