Problems with the Electrostatic Discharge (ESD) Immunity Test in Electromagnetic Compatibility (EMC)
Abstract
The electrostatic discharge (ESD) immunity test is one of the important electromagnetic compatibility (EMC) tests. The IEC standard IEC61000-4-2 is the widely used standard to test the ESD immunity for electronic equipment. Many amendments such as amendment 1 (1998), and amendment 2 (2000) have been published since 1995, but there are still problems with the ESD immunity test even with the 200x version. More than six ESD generators of different bands are tested for different equipments. The results show that the failure voltages of different ESD generators vary widely from different bands for the same test equipment. This may lead to noncomparable results when testing the ESD immunity in the EMC. Further studies show that there is a good correlation between the failure voltage and the induced voltage.
Recommended Citation
J. Huang et al., "Problems with the Electrostatic Discharge (ESD) Immunity Test in Electromagnetic Compatibility (EMC)," Proceedings of the 3rd Asia-Pacific Conference on Environmental Electromagnetics (2003, Hangzhou, China), pp. 251 - 254, Institute of Electrical and Electronics Engineers (IEEE), Nov 2003.
The definitive version is available at https://doi.org/10.1109/CEEM.2003.237958
Meeting Name
3rd Asia-Pacific Conference on Environmental Electromagnetics (2003: Nov. 4-7, Hangzhou, China)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electric Discharges; Electromagnetic Compatibility; Electronic Equipment; Electrostatic Discharge; Electrostatic Generators; Electrostatics; Equipment; Equipment Testing; Oscillators (Electronic); Standards; Different Equipment; Electromagnetic Compatibility (EMC) Tests; ESD Generator; Good Correlations; IEC Standards; Immunity Test; Induced Voltages; Test Equipments; Electrostatic Devices
International Standard Book Number (ISBN)
978-7563508020
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Nov 2003