Estimate on the Uncertainty of Predicting Radiated Emission from Near-Field Scan Caused by Insufficient or Inaccurate Near-Field Data: Evaluation of the Needed Step Size, Phase Accuracy and the Need for All Surfaces in the Huygens' Box

Abstract

Near-field scan on a Huygens' box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens' box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.

Meeting Name

Proceedings of the 2012 IEEE International Symposium on Electromagnetic Compatibility (2012: Sep. 17-21, Rome, Italy)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Huygens; Near-field; Near-field Scan; Phase Accuracy; Radiated Emissions; Simulation; Step Size; Computer Simulation; Electromagnetic Compatibility; Uncertainty Analysis; Forecasting; Huygens' Box; Predicting Radiated Emission

International Standard Book Number (ISBN)

978-1-4673-0718-5

International Standard Serial Number (ISSN)

2325-0356

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2012

Link to Full Text

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