A Systematic Method for Determining Soft-Failure Robustness of a Subsystem
A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.
B. Orr et al., "A Systematic Method for Determining Soft-Failure Robustness of a Subsystem," Proceedings of the 35th Electrical Overstress/Electrostatic Discharge Symposium (2013, Las Vegas, NV), Institute of Electrical and Electronics Engineers (IEEE), Aug 2013.
35th Electrical Overstress/Electrostatic Discharge Symposium (2013: Sep. 10-12, Las Vegas, NV)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Failure Thresholds; Mobile Phone Platforms; Root Cause; Systematic Method
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Article - Conference proceedings
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2013