SE Measurements with a TEM Cell to Study Gasket Reliability
Abstract
In this paper a near-field Shielding Effectiveness measurement approach for highly conductive gaskets while maintaining the interface is presented. SE measurements of initial gasket performance along with reliability data in hostile environments are vital for predicting a gasket performance in conjunction with specific joint surfaces. The TEM cell method reported herein offers an analytical approach for studying aging and reliability of gaskets and metal contact interfaces in place. Preserving the gasket-metal interface is critical throughout the testing and aging steps, which is an important advantage of this methodology.
Recommended Citation
P. Faraji et al., "SE Measurements with a TEM Cell to Study Gasket Reliability," Proceedings of the 2013 IEEE International Symposium on Electromagnetic Compatibility (2013, Denver, CO), pp. 462 - 465, Institute of Electrical and Electronics Engineers (IEEE), Aug 2013.
The definitive version is available at https://doi.org/10.1109/ISEMC.2013.6670457
Meeting Name
2013 IEEE International Symposium on Electromagnetic Compatibility (2013: Aug. 5-9, Denver, CO)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Analytical Approach; Hostile Environments; Joint Surfaces; Measurements Of; Metal-contact Interfaces; Near-field; Reliability Data; Shielding Effectiveness Measurements; Electromagnetic Compatibility; Machinery; Metal Testing; Reliability; Gaskets
International Standard Book Number (ISBN)
978-1-4799-0408-2; 978-1-4799-0410-5
International Standard Serial Number (ISSN)
2158-1118; 2158-110X
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2013