Scenarios of ESD Discharges to USB Connectors
Abstract
Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respective current and voltage levels, stress duration and the rise times for different USB cable shield types.
Recommended Citation
S. Marathe et al., "Scenarios of ESD Discharges to USB Connectors," Proceedings of the 39th Electrical Overstress/Electrostatic Discharge Symposium (2017, Tucson, AZ), Institute of Electrical and Electronics Engineers (IEEE), Sep 2017.
The definitive version is available at https://doi.org/10.23919/EOSESD.2017.8073431
Meeting Name
39th Electrical Overstress/Electrostatic Discharge Symposium (2017: Sep. 10-14, Tucson, AZ)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electrostatic Devices; Real-world Scenario; Stress Duration; Stress Voltages; Voltage Levels; Electrostatic Discharge
International Standard Book Number (ISBN)
978-1-58537-293-5
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Sep 2017
