Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation
Abstract
Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.
Recommended Citation
K. M. Donnell and R. Zoughi, "Application of the Dual-Loaded Modulated Scatterer Technique to Multilayered Material Evaluation," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (2011, Binjiang, Hangzhou, China), pp. 43 - 46, Institute of Electrical and Electronics Engineers (IEEE), May 2011.
The definitive version is available at https://doi.org/10.1109/IMTC.2011.5944194
Meeting Name
IEEE International Instrumentation and Measurement Technology Conference (2011: May 10-12, Binjiang, Hangzhou, China)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Embedded Sensors; Loaded Scatterer; Materials Characterization; Microwave Nondestructive Testing; Modulated Scatterer; Directional Patterns (Antenna); Elastic Constants; Instruments; Measurement Theory; Nondestructive Examination; Scattering; Embedded Sensor; Modulated Scatterer Technique
International Standard Book Number (ISBN)
978-1424479351
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2011
