Abstract
In this paper we propose a blind deconvolution method to enhance the resolution of images obtained by near-field microwave nondestructive techniques using an open ended rectangular waveguide probe. In fact, we model such images to be the result of a convolution of the real input images with a point spread function (PSF). This PSF depends mainly on the dimensions of the waveguide, the operating frequency, the nature of the object under test and standoff distance between the waveguide and the object. Unfortunately, it is very difficult to model this PSF from the physical data. For this reason, we consider the problem as a blind deconvolution. The proposed method is based on regularization, and the solution is obtained iteratively, by successive estimations of the input and the PSF. The algorithm is initialized with a PSF obtained from a very simplified physical model. The performance of the proposed method is evaluated on some real data. Several examples of real image enhancement will be presented.
Recommended Citation
A. Mohammad-Djafari et al., "A Blind Deconvolution Approach for Resolution Enhancement of Near-Field Microwave Images," Proceedings of Mathematical Modeling, Bayesian Estimation, and Inverse Problems (1999: Denver, CO), vol. 3816, pp. 274 - 281, SPIE--The International Society for Optical Engineering, Jul 1999.
The definitive version is available at https://doi.org/10.1117/12.351322
Meeting Name
Mathematical Modeling, Bayesian Estimation, and Inverse Problems (1999: Jul. 21-23, Denver, CO)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Algorithms; Estimation; Functions; Mathematical Models; Microwaves; Nondestructive Examination; Optical Resolving Power; Optical Waveguides; Blind Deconvolution; Microwave Nondestructive Testing; Point Spread Function; Image Enhancement
International Standard Serial Number (ISSN)
0277-786X
Document Type
Article - Conference proceedings
Document Version
Accepted Manuscript
File Type
text
Language(s)
English
Rights
© 1999 SPIE--The International Society for Optical Engineering, All rights reserved.
Publication Date
01 Jul 1999