A New Tail-Fit Method Design for Jitter Decomposition
Abstract
Although decreasing IC feature size and increasing I/O speed enable better system capability and performance, they also introduce technological challenges. One of the most important challenges is as I/O speed increases: jitter should decrease accordingly to ensure a reasonable bit error rate (BER) for a link system. Precise jitter characterization of signals at critical internal nodes provides valuable information for hardware fault diagnosis and next generation design. Understanding the separate contributions to jitter is challenging in this high speed industrial world. In this paper, Bounded Uncorrelated Jitter (BUJ), Random Jitter (RJ) and Periodic Jitter (PJ) are examined. A method is proposed to find BUJ in the presence of RJ, by first estimating RJ and then finding BUJ through de-convolution. A new tail-fit method is proposed to estimate the probability distribution for RJ. This new tail fit method is applicable for the general signal histogram, while the traditional tail fit method is only valid for the specific or ideal signal histogram.
Recommended Citation
C. Sui et al., "A New Tail-Fit Method Design for Jitter Decomposition," Proceedings of the 2014 IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC), vol. 2014, no. September, pp. 423 - 427, Institute of Electrical and Electronics Engineers (IEEE), Sep 2014.
The definitive version is available at https://doi.org/10.1109/ISEMC.2014.6899009
Meeting Name
2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 4-8, Raleigh, NC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Bounded Uncorrelated Jitter; De-Convolution; Jitter Decomposition
International Standard Book Number (ISBN)
978-1-4799-5544-2
International Standard Serial Number (ISSN)
2158-110X
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Sep 2014