New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter from Measurements
Abstract
A small amount of jitter can quickly eat up timing budgets and create timing issues. Precise characterization of deterministic and crosstalk-induced jitter can help isolate and solve issues within high-speed links. Characterizing deterministic and crosstalk-induced jitter is challenging, however, because many types of jitter work together to create the overall jitter profile. Methods are presented in this paper to characterize the deterministic and crosstalk-induced jitter from measurements of total jitter. An improved tail-fit deconvolution method is proposed for characterizing the impact of deterministic jitter in the presence of random jitter. The contribution of random jitter to total jitter is found first, and then that contribution is accounted for to find deterministic jitter. A Wiener filter deconvolution method is also presented for extracting the characteristics of crosstalk-induced jitter from measurements of total jitter made when the crosstalk sources were and were not present. The Wiener filter allows for accurate deconvolution of the measured histograms for total jitter even in the presence of the measurement noise. The proposed techniques are shown to work well both in simulations and in measurements of a high-speed link.
Recommended Citation
C. Sui et al., "New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter from Measurements," IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 4, pp. 877 - 884, Institute of Electrical and Electronics Engineers (IEEE), Aug 2015.
The definitive version is available at https://doi.org/10.1109/TEMC.2014.2388236
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Crosstalk-Induced Jitter; Deconvolution; Jitter Decomposition; Wiener Filter
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2015