Wideband Characterization of LCD Baseband Noise Modulation for RF Interference in Mobile Phones
Abstract
A wideband measurement technique to characterize radio frequency (RF) interference caused by a liquid crystal display (LCD) baseband noise modulation is proposed. The LCD noise in baseband frequency range modulated with the Tx carrier signal of cellular communication interferes with the Rx signal, resulting in a RF receiver desensitization problem. Since the frequency offset between the Tx and Rx bands is small (several tens of MHz), a high Tx band rejection filter is essential to characterize the relatively small modulation noise with small frequency offset along with the strong Tx carrier signal. A typical solution is to use a duplexer, which only works for the dedicated communication band and, thus, a narrow band. The proposed measurement technique utilizes a 180° hybrid coupler and reflection cancellation to obtain high Tx band rejection without any frequency limited components. In addition, another reflection cancellation method is demonstrated for a large offset frequency case.
Recommended Citation
C. Hwang et al., "Wideband Characterization of LCD Baseband Noise Modulation for RF Interference in Mobile Phones," Proceedings of the 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2017, Washington D.C.), pp. 130 - 134, Institute of Electrical and Electronics Engineers (IEEE), Oct 2017.
The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8077854
Meeting Name
2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 (2017: Aug. 7-11, Washington D.C.)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
LCD; Modulation; Radio Frequency Interference; Reflection Cancellation
International Standard Book Number (ISBN)
978-153862230-8
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Oct 2017