Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer
Abstract
A statistical BER analysis due to arbitrary supply voltage fluctuations at a single ended buffer is proposed based on analytical expressions. The probability density of jitter and the BER eye diagrams are calculated using a piecewise linear model of buffer I-V curves. The proposed analysis method is validated by comparison with HSPICE simulations. The statistical BER analysis would be very useful for quick estimation of BER due to an arbitrary supply fluctuation at a buffer.
Recommended Citation
J. Kim et al., "Statistical BER Analysis due to Supply Voltage Fluctuations at a Single-Ended Buffer," Proceedings of DesignCon 2013 (2013, Santa Clara, CA), vol. 2, pp. 1052 - 1071, UBM Electronics, Jan 2013.
Meeting Name
DesignCon 2013: Where Chipheads Connect (2013: Jan. 28-31, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Piecewise Linear Techniques
International Standard Book Number (ISBN)
978-162748472-5
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 UBM Electronics, All rights reserved.
Publication Date
01 Jan 2013
