De-Embedding Techniques for Transmission Lines: An Exploration, Review, and Proposal

Abstract

In this paper, two transmission line based de-embedding techniques are reviewed for application in 3D IC measurements. In particular, full-wave models of extremely small stripline geometries are investigated. The advantages and drawbacks of each method are discussed in reference to simulation results, and a new hybrid method is proposed.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 (2013: Aug. 5-9, Denver, CO)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Electromagnetic Compatibility; Transmission Line Theory

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2013

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