Complex Permittivity Extraction from PCB Stripline Measurement using Recessed Probe Launch
Abstract
A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.
Recommended Citation
C. Hwang et al., "Complex Permittivity Extraction from PCB Stripline Measurement using Recessed Probe Launch," IEICE Electronics Express, vol. 12, no. 5, Institute of Electrical and Electronics Engineers (IEEE), Feb 2015.
The definitive version is available at https://doi.org/10.1587/elex.12.20150023
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Complex Permittivity; Dielectric Constant; Loss Tangent; Printed Circuit Board; Recessed Probe Launch; Stripline
International Standard Serial Number (ISSN)
1349-2543
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Feb 2015
