Preliminary Study of Mutual Coupling Effect on a Passive RFID Antenna Array
Abstract
The communication quality between an RFID tag and a reader in a RFID network is affected by several factors including the distance between a reader and a tag, orientation of the antennas, and scattering from neighbor tags. Some studies have analyzed those factors and their impact on a read-rate of RFID systems. However, they neglected the effect of a mutual coupling among neighbor tags. In this paper, we formulate the driving currents of a RFID antenna array considering the mutual impedance among tags. Afterwards, we both measure and simulate the mutual impedance for the used RFID tag that is Alien 9640 Squiggle Inlay and we compare the result with half wave dipoles which we construct. Simulation results show that current distribution on tags increases when compared with the case that mutual coupling is not considered among tags.
Recommended Citation
S. E. Asl et al., "Preliminary Study of Mutual Coupling Effect on a Passive RFID Antenna Array," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life (2013, Minneapolis, MN), pp. 138 - 141, Institute of Electrical and Electronics Engineers (IEEE), May 2013.
The definitive version is available at https://doi.org/10.1109/I2MTC.2013.6555397
Meeting Name
IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life (2013: May 6-9, Minneapolis, MN)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Antenna Array; Mutual Coupling; RFID Systems; Communication Quality; Current Distribution; Driving Current; Half-Wave Dipole; Mutual Impedance; Electric Impedance; Instruments; Radio Frequency Identification (RFID); Measurements
International Standard Book Number (ISBN)
978-1467346221
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2013