Microwave Synthetic Aperture Radar Imaging using Sparse Measurement

Author

Xiahan Yang
Y. Rosa Zheng, Missouri University of Science and TechnologyFollow
Mohammad Tayeb Ahmad Ghasr, Missouri University of Science and TechnologyFollow
Kristen M. Donnell, Missouri University of Science and TechnologyFollow
R. Zoughi, Missouri University of Science and TechnologyFollow

Abstract

This paper evaluates Compressed Sensing (CS) techniques for image recovery from sparse measurement of wideband microwave synthetic aperture radar. A specimen under test (SUT) consists of a tray of small rocks of different densities and with/without one piece that is wrapped in aluminum foil. The fully-sampled measurements of the SUT are randomly under-sampled in the space domain and the images are reconstructed from measurements of 10%-50% sparse-sampling rates using conventional zero-filling (ZF) and NUFFT methods in comparison to the advanced CS method. The results show that the CS method achieves good image quality with as low as 30% sparse-sampling rate, while ZF and NUFFT require 50% to obtain acceptable quality. The reduction of spatial measurement leads to reduced cost or reduced measurement time.

Recommended Citation

X. Yang et al., "Microwave Synthetic Aperture Radar Imaging using Sparse Measurement," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (20166, Taipei, Taiwan), vol. 2016-July, Institute of Electrical and Electronics Engineers (IEEE), May 2016.

The definitive version is available at https://doi.org/10.1109/I2MTC.2016.7520526

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference (2016: May 23-26, Taipei, Taiwan)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Compressed Sensing; Synthetic Aperture Radar; Digital Signal Processing; Image Processing; Image Quality; Radar Imaging; Radar Signal Processing; Signal Reconstruction; Different Densities; Image Recovery; Measurement Time; Measurements Of; Sparse Sampling; Spatial Measurements; Wideband Microwaves

International Standard Book Number (ISBN)

978-1-4673-9220-4

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2016