Microwave Imaging With a 3-Axis multifunctional Scanning System
Abstract
In this paper design of the 3-Axis multifunctional scanning system is described. This imaging system can provide contour following, optimization of standoff distance, contact spot measurements, etc. The system was tested with microwave instrumentation using samples pertinent to construction materials and structures. The results demonstrate a capability of the system to provide the detection and evaluation of flaws in complex shape and layered structures.
Recommended Citation
S. Kharkovsky et al., "Microwave Imaging With a 3-Axis multifunctional Scanning System," Proceedings of the IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development (2014, Montevideo, Uruguay), pp. 1572 - 1575, Institute of Electrical and Electronics Engineers (IEEE), May 2014.
The definitive version is available at https://doi.org/10.1109/I2MTC.2014.6861010
Meeting Name
IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Sustainable Development (2014: May 12-15, Montevideo, Uruguay)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Construction Materials And Structures; Images; Imaging System; Inspection; Microwave Instrumentation; Reflection; Planning; Sustainable Development; Complex Shapes; Contact Spots; Contour Following; Layered Structures; Microwave Imaging; Scanning Systems; Stand-Off Distance (SoD)
International Standard Book Number (ISBN)
978-1467363853
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2014
